NEAR-FIELD SCANNING OPTICAL MICROSCOPY IS A MICROSCOPIC
TECHNIQUE FOR NANO STRUCTURE INVESTIGATION
THAT BREAKS THE
FAR
FIELD RESOLUTION LIMIT BY EXPLOITING
THE PROPERTIES OF EVANESCENT
WAVES. THIS IS DONE BY PLACING THE
DETECTOR VERY CLOSE AT A DISTANCE
MUCH SMALLER
THAN WAVELENGTH TO
THE SPECIMEN SURFACE THIS ALLOWS
FOR THE SURFACE INSPECTION WITH HIGH SPATIAL
SPECTRAL AND TEMPORAL
RESOLVING POWER WITH
THIS TECHNIQUE THE RESOLUTION OF
THE IMAGE IS LIMITED BY THE SIZE OF
THE DETECTOR APERTURE AND NOT BY THE WAVELENGTH
OF THE ILLUMINATING LIGHT